The Department of Materials has enjoyed a wide range of of instruments for high resolution electron microscopy and microanalysis for many years, backed up by a team of experienced microscopists who support users through training in existing techniques and development of new applications.
The equipment within the DCCEM can be broadly categorised as transmission electron microscopes (TEM) , scanning electron microscopes (SEM) , focused ion beam (FIB) and specimen preparation systems. Clicking on the instrument pages below takes you to a summary of the instruments and their capabilities. For more information or to work with us, please contact the support scientist listed on the relevant instrument page.
Our booking system can be found at https://oxford.corefacilities.org/